Optical Technology and Measurement for Industrial Applications Conference 2021, Volume 11927
[Place of publication not identified]: SPIE, 2021
Online
Sammelwerk, Teil eines Werkes, Elektronische Ressource
- 1 online resource (6 pages)
Ermittle Ausleihstatus...
This PDF file contains the front matter associated with SPIE Proceedings Volume 11927, including the Title Page, Copyright information, and Table of Contents.
Single pixel imaging and its applications Author(s): Kouichi Nitta -- Ghost imaging with probability estimation using convolutional neural network: improving estimation accuracy using parallel convolutional neural network Author(s): Shoma Kataoka; Yasuhiro Mizutani; Tsutomu Uenohara; Yasuhiro Takaya -- Time of flight three-dimensional imaging camera using temporal compressive sampling technique Author(s): Quang Duc Pham; Yoshio Hayasaki -- On the possibility of visualization of relief of rough surfaces via laser induced thermal emission Author(s): Kateryna Zelenska; Olga Tkach; Serge Zelensky; Olexandr Kolesnik; Toru Aoki -- Preparation of luminescent Si nanocrystals from rice husks Author(s): Kimihisa Matsumoto; So Ito; Kazuhide Kamiya; Mitsuru Inada; Hidehiro Yasuda -- Simulation study on diameter measurement technique for submicrometer-sized tapered fibers with standing wave illumination Author(s): Sojiro Murakami; Shotaro Kadoya; Satoru Takahashi -- Shape control using hologram-assisted talbot lithography Author(s): Naoki Ura; Yasuhiro Mizutani; Ryu Ezaki; Tsutomu Uenohara; Yoshihiko Makiura; Yasuhiro Takaya -- Hologram optimized in holographic laser processing system Author(s): Honghao Zhang; Satoshi Hasegawa; Haruyoshi Toyoda; Yoshio Hayasaki -- 3D profile measurement of openings with optical caliper Author(s): Lianhua Jin; Takuma Ashizawa; Toru Yoshizawa -- Modeling the dynamic optical gain in a 3D printed waveguide due to polymer swelling Author(s): Kunal Sharma; Waleed S. Mohammed; Tanujjal Bora -- Single-step fabrication of microfiber long period grating structure through a modulated arc discharge process Author(s): Pedram Hosseini; Mohammad Javad Khodarahmi; Mohmmad Kazemzadeh; Hamidreza Karimi-Alavijeh -- Noise floor comparison of optical displacement measuring interferometer between air and vacuum environments Author(s): Masato Aketagawa; Kousuke Sakasai; Masato Higuchi; Dong Wei; Thanh Dong Nguyen -- Radius measurement of large aperture long-focal-length lens using computer-generated hologram Author(s): Jian-Peng Cui; Zhi-Gang Li; Zhen-Jun Bao; Heng Zhao; Ning Zhang; Jie Liu; Di-Long Wu; Hua Xu; Ping Ma -- Out-of-plane displacement measurement using laser parallel fringes generated in camera with diffraction grating Author(s): Wei Jiang; Takuya Hara; Motoharu Fujigaki -- Optically smooth and optically rough surfaces in 3D profilometry Author(s): Pavel Pavlicek -- Mid-infrared (LWIR) Hyperspectral camera for on-site analysis Author(s): Ichiro Ishimaru -- Fringe projection method for 3D shape measurement using linear LED device and cylindrical lens array Author(s): Motoharu Fujigaki; Takuya Hara -- The FDTD analysis for diffraction limited microgroove structure with standing wave illumination for the realization of coherent structured illumination microscopy Author(s): Yizhao Guan; Masahiro Kume; Shotaro Kadoya; Masaki Michihata; Satoru Takahashi -- Resolution evaluation of displacement measuring interferometer with sinusoidal phase modulation and modified phase-locked loop Author(s): Masato Aketagawa; Masato Higuchi; Tomohiro Sowa; Dong Wei; Masato Aketagawa -- Fourier demodulation approach for a rotating polarizer analyzer polarimeter for retardance measurements Author(s): David Ignacio Serrano Garcia; Francisco Joel Cervantes Lozano; Geliztle Alejandra Parra Escamilla; Jorge L. Flores Nuñez; Guillermo Garcia Torales -- Large scale thin film thickness uniformity extraction based on dynamic spectroscopic ellipsometry Author(s): Daesuk Kim; Gukhyeon Hwang; Gukhyeon Hwang; Sukhyun Choi; Vamara Dembele; Saeid Kheiryzadehkhanghah; Inho Choi; Chung Song Kim; Daesuk Kim -- Spectroscopic polarization measurement and control using channeled spectrum Author(s): Kazuhiko Oka; Keisaku Yamane; Moritsugu Sakamoto; Ryuji Morita -- Ellipsometric characterizations of individual nanoform structures Author(s): Tim Kaeseberg; Jana Grundmann; Sven Teichert; Matthias Wurm; Thomas Siefke; Stefanie Kroker; Bernd Bodermann -- Optical and anisotropic stress properties of flexible (Ta2O5/SiO2)2 antireflection film deposited by E-gun evaporation with ion-beam assisted deposition Author(s): Kun-Hong Chen; Hsi-Chao Chen; Sheng-Bin Chen; Guan Yu Chen; Tsung Tse Wu; Kuo Chou Kai -- Calibration of the astigmatism errors induced by misalignment of quadri-wave lateral shearing interferometer Author(s): Yiwei Si; Ke Liu; Yanqiu Li; Peng Qin; Hui Zhong -- Quality map guided parallel phase unwrapping algorithm for multi-lateral shearing interferometry Author(s): Liang Wang; Ke Liu; Yanqiu Li -- Fast calibration for Star test polarimetry via polarization orthogonal basis mapping Author(s): Tianlei Ning; Guodong Zhou; Jiazhi Wang; Yanqiu Li.
Titel: |
Optical Technology and Measurement for Industrial Applications Conference 2021, Volume 11927
|
---|---|
Verantwortlichkeitsangabe: | edited by Takeshi Hatsuzawa, Rainer Tutsch, Toru Yoshizawa |
Autor/in / Beteiligte Person: | Yoshizawa, Toru [editor.] ; Tutsch, Rainer [editor.] ; Hatsuzawa, Takeshi [editor.] |
Lokaler Link: | |
Verwandtes Werk: | |
Veröffentlichung: | [Place of publication not identified]: SPIE, 2021 |
Medientyp: | Sammelwerk, Teil eines Werkes |
Datenträgertyp: | Elektronische Ressource |
Umfang: | 1 online resource (6 pages) |
ISBN: | 1-5106-4723-6 |
DOI: | 10.1117/12.2622511 |
Schlagwort: |
|
Sonstiges: |
|