MEMORY DEVICE INCLUDING TEST PAD CONNECTION CIRCUIT
2024
Online
Patent
A memory device includes a test mode detector circuit that determines whether the memory device has entered a test mode based on at least one test mode entry signal received through at least one pin of a plurality of pins and generates a test mode detection signal, and a test pad connection circuit that electrically couples a first pin of the plurality of pins to a dedicated test pad of the test mode such that a signal applied to the first pin is transmitted to the dedicated test pad based on the test mode detection signal.
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MEMORY DEVICE INCLUDING TEST PAD CONNECTION CIRCUIT
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Veröffentlichung: | 2024 |
Medientyp: | Patent |
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