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- Nachgewiesen in: USPTO Patent Applications
- Sprachen: English
- Document Number: 20240077535
- Publication Date: March 7, 2024
- Appl. No: 18/300870
- Application Filed: April 14, 2023
- Assignees: Samsung Electronics Co., Ltd. (Suwon-si, KR)
- Claim: 1. A test board comprising: a substrate including a device under test (DUT) placement area where a first device under test and a second device under test are disposed; a first load switch connected in series with the first device under test, and configured to be set to a switch on state or a switch off state based on a first enable signal; a second load switch connected in series with the second device under test, and configured to be set to the switch on state or the switch off state depending on a second enable signal; and a test controller, wherein the test controller is configured to perform a test operation in a (1-1)-th mode by activating the first enable signal and deactivating the second enable signal and then perform the test operation in a (1-2)-th mode by deactivating the first enable signal and activating the second enable signal, wherein the test controller includes a power source configured to generate a test power and provide the power source to the first load switch and the second load switch, when the test operation is performed, wherein in the (1-1)-th mode, the first load switch is configured to be set to the switch on state and the second load switch is configured to be set to the switch off state, to perform the test operation on the first device under test, and wherein in the (1-2)-th mode, the first load switch is configured to be set to the switch off state and the second load switch is configured to be set to the switch on state, to perform the test operation on the second device under test.
- Claim: 2. The test board of claim 1, wherein the power source is configured to distribute and provide the test power to the first load switch and the second load switch.
- Claim: 3. The test board of claim 2, wherein in the (1-1)-th mode, a first supply power is configured to be supplied from the first load switch to the first device under test and is not configured to be supplied to the second device under test, and in the (1-2)-th mode, a second supply power is configured to be supplied from the second load switch to the second device under test and is not configured to be supplied to the first device under test.
- Claim: 4. The test board of claim 3, wherein the test controller is configured to simultaneously activate the first enable signal and the second enable signal such that the test operation is performed in a second mode, and in the second mode in which the first load switch and the second load switch are set to the switch on state, the test controller is configured to simultaneously perform the test operation on the first device under test and the second device under test.
- Claim: 5. The test board of claim 4, wherein in the second mode, a third supply power is supplied from the first load switch to the first device under test and from the second load switch to the second device under test.
- Claim: 6. The test board of claim 5, wherein a magnitude of the first supply power is greater than a magnitude of the third supply power.
- Claim: 7. The test board of claim 6, wherein the magnitude of the first supply power is two times the magnitude of the third supply power.
- Claim: 8. The test board of claim 1, wherein the test controller is configured to: generate and provide a test input signal to the first device under test and the second device under test; and receive a test output signal output from each of the first and second devices under test to generate test data including a test result.
- Claim: 9. The test board of claim 8, wherein the test controller is configured to sequentially operate in the (1-1)-th mode and the (1-2)-th mode based on the test input signal.
- Claim: 10. The test board of claim 1, wherein the test controller is configured to sequentially operate in the (1-1)-th mode and the (1-2)-th mode based on power consumption for each device under test when the test operation is performed.
- Claim: 11. A test method using a test board configured to perform a test operation for a first test item with respect to a first device under test and a second device under test, the method comprising: performing the test operation for the first test item in a (1-1)-th mode by activating a first enable signal provided to a first load switch connected with the first device under test and deactivating a second enable signal provided to a second load switch connected with the second device under test; and performing the test operation for the first test item in a (1-2)-th mode by deactivating the first enable signal and activating the second enable signal, wherein, in the (1-1)-th mode in which the first load switch is set to a switch on state and the second load switch is set to a switch off state, the test operation for the first test item is performed on the first device under test, and wherein in the (1-2)-th mode in which the first load switch is set to the switch off state and the second load switch is set to the switch on state, the test operation for the first test item is performed on the second device under test.
- Claim: 12. The method of claim 11, wherein in the (1-1)-th mode, a first supply power is supplied from the first load switch to the first device under test and is not supplied to the second device under test, and in the (1-2)-th mode, a second supply power is supplied from the second load switch to the second device under test and is not supplied to the first device under test.
- Claim: 13. The method of claim 12, further comprising: performing a test operation for a second test item, wherein the test operation for the second test item includes performing the test operation for the second test item in a second mode in which the first enable signal provided to the first load switch connected with the first device under test and the second enable signal provided to the second load switch connected with the second device under test are simultaneously activated.
- Claim: 14. The method of claim 13, wherein in the second mode, a third supply power is supplied from the first load switch to the first device under test and from the second load switch to the second device under test.
- Claim: 15. The method of claim 14, wherein a magnitude of the first supply power is greater than a magnitude of the third supply power.
- Claim: 16. A test method comprising: calculating a minimum supply power to be supplied to a plurality of first devices under test and a plurality of second devices under test as a reference power; obtaining power consumption for each device under test when a test operation for a test item is performed; when the power consumption for each device under test is greater than the reference power, performing the test operation for the test item on the plurality of first devices under test in a (1-1)-th mode where a first enable signal provided to a plurality of first load switches connected with the plurality of first devices under test is activated and a second enable signal provided to a plurality of second load switches connected with the plurality of second devices under test is deactivated and then performing the test operation on the plurality of second devices under test in a (1-2)-th mode where the first enable signal is deactivated and the second enable signal is activated, and when the power consumption for each device under test is smaller than the reference power, simultaneously performing the test operation for the test item on the plurality of first devices under test and the plurality of second devices under test in a second mode where the first enable signal and the second enable signal are simultaneously activated.
- Claim: 17. The method of claim 16, wherein, in the (1-1)-th mode, a first supply power is supplied from the first load switches to the first devices under test and is not supplied to the second devices under test, and in the (1-2)-th mode, a second supply power is supplied from the second load switches to the second devices under test and is not supplied to the first devices under test.
- Claim: 18. The method of claim 17, wherein in the second mode, a third supply power is supplied from the first load switches to the first devices under test and from the second load switches to the second devices under test.
- Claim: 19. The method of claim 18, wherein a magnitude of the first supply power is greater method of a magnitude of the third supply power.
- Claim: 20. The method of claim 18, wherein a magnitude of the minimum supply power is identical to the magnitude of the third supply power.
- Current International Class: 01; 01
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